Polymer doped metal oxide thin films has emerged as promising materials in recent years for advanced electronic and optoelectronic devices. Polymethylmethacrylate (PMMA) doped iron oxide thin films were deposited on glass substrate using sol-gel spin coating method. The prepared films were characterized by X- ray diffraction (XRD), Scanning electron microscope (SEM) and Fourier transform infrared (FTIR) study. The XRD result shows that the film structure was changed from amorphous to crystalline nature by increasing the PMMA doping concentration. The calculated crystallite size of the PMMA doped iron oxide varied from 35 nm to 44 nm as the concentration is increased (10% - 30%) The SEM image indicates the agglomerated grains on the substrate surface. From FTIR spectrum, metal – oxygen and PMMA vibration modes are observed at 450 cm-1 and 980 cm-1 respectively. These results suggest that the PMMA doped iron oxide thin film is a potential candidate for optoelectronic applications.